Fourier series expansion method for gain measurement from amplified spontaneous emission spectra of Fabry-Perot semiconductor lasers

被引：17

作者：

Guo, WH ^{[1
]}

Lu, QY ^{[1
]}

Huang, YZ ^{[1
]}

Yu, LJ ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 2004年 / 40卷 / 02期

基金：

中国国家自然科学基金;

关键词：

amplified spontaneous emission (ASE); Fourier series; gain measurement; Hakki-Paoli; semiconductor lasers;

D O I：

10.1109/JQE.2003.821535

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A gain measurement technique, based on Fourier series expansion of periodically extended single fringe of the amplified spontaneous emission spectrum, is proposed for Fabry-Perot semiconductor lasers. The underestimation of gain due to the limited resolution of the measurement system is corrected by a factor related to the system response function. The standard deviations of the gain-reflectivity product under low noise conditions are analyzed for the Fourier series expansion method and compared with those of the Hakki-Paoli method and Cassidy's method. The results show that the Fourier series expansion method is the least sensitive to noise among the three methods. The experiment results obtained by the three methods are also presented and compared.

引用

页码：123 / 129

页数：7

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