Reduction of Electron Leakage of AlGaN-Based Deep Ultraviolet Laser Diodes Using an Inverse-Trapezoidal Electron Blocking Layer

被引:24
作者
Xing, Zhong-Qiu [1 ,2 ,3 ]
Zhou, Yong-Jie [4 ]
Liu, Yu-Huai [1 ,2 ,3 ]
Wang, Fang [1 ,2 ,3 ]
机构
[1] Zhengzhou Univ, Natl Joint Res Ctr Elect Mat & Syst, Zhengzhou 450001, Peoples R China
[2] Zhengzhou Univ, Int Joint Lab Electron Mat & Syst, Zhengzhou 450001, Peoples R China
[3] Zhengzhou Univ, Sch Informat Engn, Zhengzhou 450001, Peoples R China
[4] Xinyang Normal Univ, Sch Phys & Elect Engn, Xinyang 464000, Peoples R China
基金
中国国家自然科学基金;
关键词
LIGHT-EMITTING-DIODES; OPTICAL-PROPERTIES; INGAN; POLARIZATION; IMPROVEMENT; ADVANTAGE;
D O I
10.1088/0256-307X/37/2/027302
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
To improve the optical and electrical properties of AlGaN-based deep ultraviolet lasers, an inverse-trapezoidal electron blocking layer is designed. Lasers with three different structural electron blocking layers of rectangular, trapezoidal and inverse-trapezoidal structures are established. The energy band, electron concentration, electron current density, P-I and V-I characteristics, and the photoelectric conversion efficiency of different structural devices are investigated by simulation. The results show that the optical and electrical properties of the inverse-trapezoidal electron blocking layer laser are better than those of rectangular and trapezoidal structures, owing to the effectively suppressed electron leakage.
引用
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页数:5
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