Electric double-layer transistors: a review of recent progress

被引:205
|
作者
Du, Haiwei [1 ]
Lin, Xi [1 ]
Xu, Zhemi [1 ]
Chu, Dewei [1 ]
机构
[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
基金
澳大利亚研究理事会;
关键词
FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; METAL-INSULATOR-TRANSITION; GATED CARBON NANOTUBE; SINGLE-CRYSTAL TRANSISTORS; YTTRIA-STABILIZED ZIRCONIA; LOW-VOLTAGE; IONIC-LIQUID; OXIDE-SEMICONDUCTOR; THERMOELECTRIC PROPERTIES;
D O I
10.1007/s10853-015-9121-y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
With the miniaturization of electronic devices, it is essential to achieve higher carrier density and lower operation voltage in field-effect transistors (FETs). However, this is a great challenge in conventional FETs owing to the low capacitance and electric breakdown of gate dielectrics. Recently, electric double-layer technology with ultra-high charge-carrier accumulation at the semiconductor channel/electrolyte interface has been creatively introduced into transistors to overcome this problem. Some interesting electrical transport characteristics such as superconductivity, metal-insulator transition, and tunable thermoelectric behavior have been modulated both theoretically and experimentally in electric double-layer transistors (EDLTs) with various semiconductor channel layers and electrolyte materials. The present article is a review of the recent progress in the EDLTs and the impacts of EDLT technology on modulating the charge transportation of various electronics.
引用
收藏
页码:5641 / 5673
页数:33
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