Quasi-TEM Analysis of Symmetrical Shielded Broadside-Coupled Microstrip Lines

被引：0
|
作者：
Bououden, Ali [1 ,2 ]
Riabi, Mohamed L. [1 ,2 ]
Saadi, Abdelhalim A. [3 ]
Yagoub, Mustapha C. E. [4 ]
机构：
[1] Univ Constantine 1, Lab Electromagnetismes & Telecommun, Route Ain El Bey, Constantine 25000, Algeria
[2] Ctr Dev Technol Avancees, Baba Hassen, Algeria
[3] NXP Semicond, F-92150 Suresnes, France
[4] Univ Ottawa, Sch Elect Engn & Comp Sci, Ottawa, ON K1N 6N5, Canada
来源：
PROGRESS IN ELECTROMAGNETICS RESEARCH M | 2021年 / 100卷
关键词：
TRANSMISSION-LINES; DESIGN; MICROWAVE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this work, a numerical quasi-static approach is proposed to efficiently analyze symmetrical shielded broadside-coupled microstrip line (SBCML) structures. Based on the modified least squares boundary residual method combined with a variational technique, this approach allows accurate computation of the electrical/geometrical parameters of different SBCML configurations. The errors for the quasi-TEM electrical parameters range are less than 4%. The proposed technique was demonstrated through successful comparison with data from published works and results obtained from commercial EM simulators like CST-EMS and COMSOL.
引用
收藏
页码：213 / 223
页数：11
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