Non-Contact Thickness Gauge for Conductive Materials Using HTS SQUID System

被引:15
作者
Kiwa, Toshihiko [1 ]
Tahara, Hideaki [1 ]
Miyake, Etsuro [1 ]
Yamada, Hironobu [1 ]
Tsukada, Keiji [1 ]
机构
[1] Okayama Univ, Grad Sch Nat Sci & Technol, Okayama 7008530, Japan
关键词
Eddy current testing; Fourier transforms; high-temperature superconductors; nondestructive testing; SQUIDs;
D O I
10.1109/TASC.2009.2019196
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Eddy current testing using high-superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses G(A) (f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The G(A)(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.
引用
收藏
页码:801 / 803
页数:3
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