Non-Contact Thickness Gauge for Conductive Materials Using HTS SQUID System

被引：15

作者：

Kiwa, Toshihiko ^{[1
]}

Tahara, Hideaki ^{[1
]}

Miyake, Etsuro ^{[1
]}

Yamada, Hironobu ^{[1
]}

Tsukada, Keiji ^{[1
]}

机构：

[1] Okayama Univ, Grad Sch Nat Sci & Technol, Okayama 7008530, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2009年 / 19卷 / 03期

关键词：

Eddy current testing; Fourier transforms; high-temperature superconductors; nondestructive testing; SQUIDs;

D O I：

10.1109/TASC.2009.2019196

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Eddy current testing using high-superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses G(A) (f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The G(A)(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.

引用

页码：801 / 803

页数：3

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