A method for the calibration of magnetic force microscopy tips

被引：103
作者：
van Schendel, PJA [1 ]
Hug, HJ [1 ]
Stiefel, B [1 ]
Martin, S [1 ]
Güntherodt, HJ [1 ]
机构：
[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
来源：
JOURNAL OF APPLIED PHYSICS | 2000年 / 88卷 / 01期
关键词：
D O I：
10.1063/1.373678
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A method is presented for the analysis of magnetic force microscopy (MFM) measurements that allows the quantitative determination of the sample stray field. It is shown how measurements on an easily obtainable calibration sample can be used to calibrate the MFM measurement as a function of the wavelength of the sample stray field at the tip apex. It is demonstrated that the thus obtained MFM calibration can be used to determine the stray field distribution of the tip. Furthermore, the effect of the tip on the MFM imaging mechanism is analyzed by comparing it to some simple tip models. From the analysis, it is shown that the point-monopole and dipole models do not accurately describe the MFM imaging mechanism. (C) 2000 American Institute of Physics. [S0021-8979(00)09113-1].
引用
收藏
页码：435 / 445
页数：11
相关论文
共 26 条
[1]   Comparing the resolution of magnetic force microscopes using the CAMST reference samples [J].
Abelmann, L ;
Porthun, S ;
Haast, M ;
Lodder, C ;
Moser, A ;
Best, ME ;
van Schendel, PJA ;
Stiefel, B ;
Hug, HJ ;
Heydon, GP ;
Farley, A ;
Hoon, SR ;
Pfaffelhuber, T ;
Proksch, R ;
Babcock, K .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1998, 190 (1-2) :135-147
[2]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[3]   Field-dependence of microscopic probes in magnetic force microscopy [J].
Babcock, KL ;
Elings, VB ;
Shi, J ;
Awschalom, DD ;
Dugas, M .
APPLIED PHYSICS LETTERS, 1996, 69 (05) :705-707
[4]   Investigation of the domain contrast in magnetic force microscopy [J].
Belliard, L ;
Thiaville, A ;
Lemerle, S ;
Lagrange, A ;
Ferre, J ;
Miltat, J .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (08) :3849-3851
[5]   MAGNETIC DOMAIN-STRUCTURE IN ULTRATHIN FILMS [J].
BOCHI, G ;
HUG, HJ ;
PAUL, DI ;
STIEFEL, B ;
MOSER, A ;
PARASHIKOV, I ;
GUNTHERODT, HJ ;
OHANDLEY, RC .
PHYSICAL REVIEW LETTERS, 1995, 75 (09) :1839-1842
[6]  
BOCHI G, 1995, PHYS REV B, V52, P7311, DOI 10.1103/PhysRevB.52.7311
[7]   DECONVOLUTION OF MAGNETIC FORCE IMAGES BY FOURIER-ANALYSIS [J].
CHANG, T ;
LAGERQUIST, M ;
ZHU, JG ;
JUDY, JH ;
FISCHER, PB ;
CHOU, SY .
IEEE TRANSACTIONS ON MAGNETICS, 1992, 28 (05) :3138-3140
[8]   Characterisation of MFM tip fields by electron tomography [J].
Ferrier, RP ;
McVitie, S ;
Gallagher, A ;
Nicholson, WAP .
IEEE TRANSACTIONS ON MAGNETICS, 1997, 33 (05) :4062-4064
[9]   Nonlinear magnetoelastic anisotropy in Cu/Ni/Cu/Si(001) films [J].
Ha, K ;
O'Handley, RC .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) :5282-5284
[10]   Quantitative magnetic force microscopy on perpendicularly magnetized samples [J].
Hug, HJ ;
Stiefel, B ;
van Schendel, PJA ;
Moser, A ;
Hofer, R ;
Martin, S ;
Guntherodt, HJ ;
Porthun, S ;
Abelmann, L ;
Lodder, JC ;
Bochi, G ;
O'Handley, RC .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) :5609-5620
123