Intercomparison Test on High Current Shunts for High Power Testing with STL Reference Shunt

被引：0

作者：

Kim, Min Kyu ^{[1
]}

Ryu, Jung Hyeon ^{[1
]}

Park, Chan Gyo ^{[1
]}

Kim, Ik Soo ^{[1
]}

Lee, Yong Han ^{[1
]}

Rhyou, Hyeong Kee ^{[1
]}

Han, Jong Hoon ^{[2
]}

机构：

[1] Korea Electrotechnol Res Inst, High Voltage High Power Testing & Evaluat Div, Chang Won, South Korea

[2] Korea Electrotechnol Res Inst, Power Apparat Testing & Evaluat Div, Uiwang, South Korea

来源：

2015 3RD INTERNATIONAL CONFERENCE ON ELECTRIC POWER EQUIPMENT - SWITCHING TECHNOLOGY (ICEPE-ST) | 2015年

关键词：

intercomparison; proficiency; uncertainty; shunt; high current;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In general, an establishment of the traceability on high voltage and high-current measurement systems in approved testing laboratories can be made through the intercomparison test with the international reference system. This paper shows the results of inter-comparison between KERI and Asian STL(Short-circuit Testing Liaison) reference shunt. The expanded measurement uncertainty was calculated with uncertainty components such as scale factor, non-linearity effect, interference effect and temperature effect. Also inter-laboratory comparison proficiency testing scheme for assuring the quality of the results in the high power testing laboratories is introduced. Consequently, the difference in scale factor of the shunts participating in the proficiency testing was calculated to be less than 0.2%.

引用

页码：596 / 600

页数：5

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