Layer thickness dependence of the phase separation and phase change properties of Ge2Sb2Te5/TiN superlattice-like thin films

被引:4
作者
Zheng, Long [1 ,2 ,3 ,5 ]
Hu, Yifeng [1 ]
Yang, Xingming [2 ,3 ]
Xie, Weimei [2 ,3 ]
Zhu, Xiaoqin [1 ]
Lai, Tianshu [4 ]
Song, Zhitang [5 ]
机构
[1] Jiangsu Univ Technol, Sch Math & Phys, Changzhou 213001, Peoples R China
[2] Nanjing Univ, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
[3] Nanjing Univ, Dept Phys, Nanjing 210093, Jiangsu, Peoples R China
[4] Sun Yat Sen Univ, Dept Phys, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China
[5] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
来源
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 2018年 / 238卷
关键词
Ge2Sb2Te5; Superlattice-like structure; Phase separation; Phase-change memory; ULTRA-HIGH-SPEED; RAMAN-SCATTERING; MECHANISM;
D O I
10.1016/j.mseb.2018.12.014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The dependence on the layer thickness of the structural and phase change properties of Ge2Sb2Te5/TiN superlattice-like thin films are investigated. The phase separation of binary Sb2Te3 and GeTe phases is investigated using X-ray diffraction and Raman spectral analysis. The Ge2Sb2Te5/TiN interface is believed lead to phase separation, as well as the interface effects that facilitate the phase separation process in the superlattice-like films. In this investigation of the phase change properties, the critical temperature, 10-year lifetime temperature, phase change speed, and optical band gap are measured. We found that the phase change properties of Ge2Sb2Te5 are greatly improved by increasing the layer thickness as a result of the phase separation suppression in the structure. This superlattice-like thin film may have potential in high-speed phase change memory applications.
引用
收藏
页码:71 / 75
页数:5
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