Modelling the creep rates of eutectic Bi-Sn solder using the data from its constitutive phases

被引:20
作者
Raeder, CH [1 ]
Mitlin, D
Messler, RW
机构
[1] Adv Micro Devices Inc, Austin, TX USA
[2] Univ Calif Berkeley, Dept Mat Sci, Berkeley, CA 94720 USA
[3] Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[4] Rensselaer Polytech Inst, Dept Mat Sci & Engn, Troy, NY 12181 USA
关键词
D O I
10.1023/A:1004439931547
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Constitutive equations obtained from the creep behaviour of 99.9 wt % pure Bi and from Sn-10wt% Bi single-phase solid solution are applied in the continuum mechanics creep model of Tanaka et al. [1] to predict the creep behaviour of a eutectic Bi-42 wt % Sn alloy. At low stresses, Bi is the load bearing phase, while at high stresses, Sn-10 wt % Bi is the load bearing phase. The continuum mechanics creep model is able to predict the shape of the steady-state versus strain curves. However, the model predicts creep rates that are generally lower than the data. This inconsistency may be caused by a phase boundary sliding contribution to the creep rate, which is unaccounted for by the model. Creep tests done on Sn-42wt% Bi samples having various microstructural morphologies support this conclusion, where the more spheroidized microstructure creeps faster. (C) 1998 Kluwer Academic Publishers.
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页码:4503 / 4508
页数:6
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