Magnetic Flux Leakage Testing for Defect Characterization

被引：2

作者：

Cheng, Weiying ^{[1
]}

Kamiyama, Yoshinori ^{[1
]}

Tsukada, Keiji ^{[2
]}

机构：

[1] Japan Power Engn & Inspect Corp, NDE Ctr, Tokyo, Japan

[2] Okayama Univ, Okayama 7008530, Japan

来源：

ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (XIX) | 2016年 / 41卷

关键词：

Magnetic flux leakage testing; back-side wall thinning; local thinning; magnetic characterization; Magneto-Impedance sensor;

D O I：

10.3233/978-1-61499-639-2-126

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.

引用

页码：126 / 133

页数：8

共 6 条

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