Two-dimensional discrete dislocation models of deformation in polycrystalline thin metal films on substrates

被引：12

作者：

Hartmaier, A ^{[1
]}

Buehler, MJ ^{[1
]}

Gao, HJ ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2005年 / 400卷

关键词：

thin films; polycrystals; plasticity; dislocation dynamics; diffusion;

D O I：

10.1016/j.msea.2005.03.069

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The time-dependent irreversible deformation of polycrystalline thin metal films on substrates is investigated using two-dimensional discrete dislocation dynamics models incorporating essential parameters determined from atomistic studies. The work is focused on the mechanical properties of uncapped films, where diffusive processes play an important role. The simulations incorporate dislocation climb along the grain boundary as well as conservative glide. Despite of severe limitations of the two-dimensional dislocation models, the simulation results are found to largely corroborate experimental findings on different dominant deformation mechanisms at different film thicknesses. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：260 / 263

页数：4

共 13 条

[1] Parallel glide: unexpected dislocation motion parallel to the substrate in ultrathin copper films [J].