Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 films by pulsed laser deposition

被引：16

作者：

Zhong, XL ^{[1
]}

Lu, L ^{[1
]}

Lai, MO ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore

来源：

SURFACE & COATINGS TECHNOLOGY | 2005年 / 198卷 / 1-3期

关键词：

pulsed laser deposition; LaNiO3 (LNO); 0.65Pb(Mg1/3Nb2/3)O-3-0.35PbTiO(3) (PMN-PT);

D O I：

10.1016/j.surfcoat.2004.10.131

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

0.65Pb(Mg1/3Nb2/3)O-3-0.35PbTiO(3) thin films (PMN-PT) on LaNiO3 (LNO) metallic oxide electrode were successfully deposited using pulsed laser deposition technique. LaAlO3 (LAO) and SiO2/Si were employed as substrates. By controlling the operating parameters, high quality with preferred orientation of growth of PMN films on LNO were successfully fabricated. XRD Bragg scan (theta-2 theta) of optimized PMN-PT/LNO/SiO2/Si and PMN-PT/LNO/LAO films showed (100) and (200) peaks of the pseudocubic PMN-PT and LNO only indicating the nature of highly orientated out-of-plane texture. In-plan orientations of the films of PMN-PT/LNO/LAO were studied by phi scan, which demonstrated cube-on-cube orientation, namely, perovskite [100]parallel to LNO pseudo-cubic [100]parallel to LAO [100]. The crystalline quality of the (100) orientated films were examined by rocking curves of (200) reflections. The full-width at half-maximum (FWHM) value of PMN-PT on LAO substrate is 2.4 degrees. Mechanical properties of the PMN-PT film were studied using nano-indentation technique and piezoelectric properties were characterized by a ferroelectric tester. (c) 2004 Elsevier B.V. All rights reserved.

引用

页码：400 / 405

页数：6

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