Backscattered electron detection in environmental SEM

被引:13
作者
Danilatos, G. D. [1 ]
机构
[1] ESEM Res Lab, Bondi Jct, NSW 2026, Australia
关键词
YAG; YAP; BSE; ESEM; backscattered electron detection; BSE detection efficiency; light pipe; SNR; optimum BSE detector; NE102A; CRYSTAL SCINTILLATION DETECTORS; SINGLE-CRYSTAL; LIGHT TRANSPORT; BEAM TRANSFER; PHOTOMULTIPLIER; CONSTRUCTION; MICROSCOPE; DESIGN;
D O I
10.1111/j.1365-2818.2011.03559.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
An examination of the backscattered electron imaging status in environmental scanning electron microscopy is presented with particular attention to the testing and use of cerium doped yttrium aluminium garnet and yttrium aluminium perovskite scintillation detectors. A comparison is made with plastic scintillating backscattered electron detectors used previously (Nuclear Enterprises type NE102A scintillator). Semi-disk, strip and wedge shapes of these materials have been tested in conjunction with various light-guide geometries. These systems have been combined with two different types of photomultipliers, which also play a critical role in the total detector efficiency. The advantage of increased light output from the monocrystal materials is gained only if matched with suitable light-guides and photomultipliers. The associated problems are discussed and proposals for further work are made for the construction of most efficient backscattered electron detectors in the environmental scanning electron microscope.
引用
收藏
页码:171 / 185
页数:15
相关论文
共 36 条
[1]  
[Anonymous], MICROBEAM ANAL
[2]  
[Anonymous], J MICROSC
[3]  
[Anonymous], P 44 ANN M EMSA
[4]  
[Anonymous], GASEOUS DETECTOR DEV
[5]  
[Anonymous], [No title captured]
[6]  
[Anonymous], MICRON IN PRESS
[7]  
[Anonymous], SCANNING MICROSC I S
[8]   Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM [J].
Arnoult, Claire ;
Di Martino, Jean ;
Khouchaf, Lahcen ;
Toniazzo, Valerie ;
Ruch, David .
MICRON, 2011, 42 (08) :877-883
[9]   A DOUBLE DETECTOR SYSTEM FOR BSE AND SE IMAGING [J].
AUTRATA, R .
SCANNING, 1984, 6 (04) :174-182
[10]  
AUTRATA R, 1983, SCAN ELECTRON MICROS, P489