Experimental evidence of copper insertion in a crystallographic structure of Ti3SiC2 MAX phase

被引:25
作者
Dezellus, Olivier [1 ]
Gardiola, Bruno [1 ]
Andrieux, Jerome [1 ]
Lay, Sabine [2 ,3 ]
机构
[1] Univ Lyon 1, CNRS, UMR 5615, Lab Multimat & Interfaces, F-69100 Villeurbanne, France
[2] Ecole Natl Super Electrochim & Electrome Grenoble, Thermodynam & Physicochim Met Lab, CNRS, SIMAP, F-38402 St Martin Dheres, France
[3] Univ Grenoble Alpes, F-38402 St Martin Dheres, France
关键词
MAX phase; Copper; Reactivity; Insertion; MICROSTRUCTURE; COMPOSITES; TI2ALC; CU;
D O I
10.1016/j.scriptamat.2015.03.015
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Chemical interaction of Ti3SiC2 substrate with silver-copper (Ag-Cu) melt is studied after several minutes of contact at 800 degrees C and 900 degrees C. Experimental evidence of Cu insertion into the crystallographic structure of Ti3SiC2 is given both by X-ray energy dispersive spectroscopy (composition is about Ti47Cu8Si13C32) and by electronic diffraction patterns obtained by transmission electronic microscopy for single grains. Moreover, the X-ray diffraction pattern shows that insertion of Cu induces a slight increase in the lattice parameters and a modification of peak intensities. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:17 / 20
页数:4
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