Electromagnetic Near-Field Nanoantennas for Subdiffraction-Limited Surface Plasmon-Enhanced Light Microscopy

被引:15
作者
Lee, Wonju [1 ]
Kim, Kyujung [1 ]
Kim, Donghyun [1 ]
机构
[1] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea
基金
新加坡国家研究基金会;
关键词
Field localization; imaging resolution; microscopy; nanoantennas; surface plasmon; INTERNAL-REFLECTION FLUORESCENCE; NANO-APERTURES; METAL; RESONANCE; LOCALIZATION; TRANSMISSION; CONFINEMENT; SENSITIVITY; PROTEINS; OPTICS;
D O I
10.1109/JSTQE.2012.2190046
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We investigate electromagnetically amplified local fields or hot spots created by surface nanoantennas for subdiffraction-limited plasmon-enhanced microscopy under total internal reflection at angled light incidence. Different shapes of near-field hot spots were calculated by varying geometrical parameters of nanoantenna structures. An inverse relationship between full-width-at-half-maximum (FWHM) and ellipticity of a hot spot was found. Among the three patterns considered, square nanoantenna patterns provided the smallest FWHM ellipticity product with a spot size of approximately 53 x 110 nm(2) due to efficient plasmon localization. The size of a nanopattern affects FWHM significantly by producing a smaller hot spot if the size decreases. The effects of other parameters are also discussed.
引用
收藏
页码:1684 / 1691
页数:8
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