Efficiency calibrations of cylindrically bent transmission crystals in the 20 to 80 keV x-ray energy range

被引：17

作者：

Szabo, Csilla I. ^{[4
]}

Feldman, Uri ^{[4
]}

Seltzer, Stephen ^{[4
]}

Hudson, Lawrence T. ^{[3
]}

O'Brien, Michelle ^{[3
]}

Park, Hye-Sook ^{[2
]}

Seely, John F. ^{[1
]}

机构：

[1] USN, Res Lab, Div Space Sci, Washington, DC 20036 USA

[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[3] NIST, Gaithersburg, MD 20899 USA

[4] Artep Inc, Ellicott City, MD 21042 USA

来源：

OPTICS LETTERS | 2011年 / 36卷 / 08期

关键词：

SPECTROGRAPHY;

D O I：

10.1364/OL.36.001335

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Two quartz (10-11) crystals were cylindrically bent to a 25: 4 cm radius of curvature and were mounted in identical Cauchois-type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5% absolute accuracy using narrow bandwidth x-ray source fluences in the 20 to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x- ray emission levels from laser- produced plasmas and other laboratory sources.

引用

页码：1335 / 1337

页数：3

共 8 条

[1] X ray spectrography by transmission of a nonchanneled beam through a curved crystal (I). [J].