Fault diagnosis of combinational circuit based on generation algorithm

被引：0

作者：

Zhang Fan ^{[1
]}

Hu Yun-an ^{[1
]}

Zheng Zhi-gang ^{[1
]}

机构：

[1] Naval Aeronaut Engn Inst, Grad Students Brigade, Yantai 264001, Peoples R China

来源：

Proceedings of the 2007 Chinese Control and Decision Conference | 2007年

关键词：

generation algorithm; fitness; test vector generation;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In the GA's test generation algorithm, for decreasing the complexity of the fitness functions, one test generation algorithm is proposed for combinational circuits and the fitness functions is simplified. The search space and the test generation time are reduced. The fault coverage is improved.

引用

页码：608 / 610

页数：3