Powerful topographic analyzing technique using Fast Fourier Transform for c-Si solar cells and emerging technologies

被引:0
作者
Saliou, Karolien [1 ]
Hilt, Florian [1 ,2 ]
Chevalier, Clotaire [1 ]
Fischer, Guillaume [1 ]
Hildebrandt, Thibaud [1 ,3 ]
Grand, Pierre-Philippe [1 ,3 ]
Drahi, Etienne [1 ,2 ]
机构
[1] IPVF Inst Photovolta Ile De France, 30 Route,Dept 128, F-91120 Palaiseau, France
[2] Total SA Renewables, 2 Pl Jean Millier, F-92078 Paris, France
[3] EDF R&D, 30 Route,Dept 128, F-91120 Palaiseau, France
来源
2019 IEEE 46TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2019年
关键词
roughness; FFT; spatial frequencies; silicon;
D O I
10.1109/pvsc40753.2019.8980904
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Light management of a solar cell can be enhanced by improving J(sc) with proper texturing. Topographic images obtained by confocal laser microscopy or AFM are used to study the roughness of textured surfaces. Fast Fourier Transform is employed to separate and select spatial frequencies, which will be analyzed through MountainsMap (R). Various kind of samples can be studied such as textured c-Si solar cells or even tandem devices made of perovskite grains evaporated on Si pyramids. The structural, morphological and geometrical results can be extracted in a fast, automatic and repeatable way with a good throughput to enable statistical analysis.
引用
收藏
页码:412 / 417
页数:6
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