The Effect of the Annealing on the Properties of ZnO/Cu/ZnO Multilayer Structures

被引:7
作者
Rasheed, Hiba S. [1 ,2 ]
Ahmed, Naser M. [1 ]
Matjafri, M. Z. [1 ]
Sabah, Fayroz A. [1 ,3 ]
Al-Rawi, Hamzah N. [4 ]
机构
[1] Univ Sains Malaysia, Sch Phys, Nanooptoelect Res & Technol Lab, George Town 11800, Malaysia
[2] Al Mustansiriya Univ, Coll Educ, Dept Phys, Baghdad, Iraq
[3] Al Mustansiriya Univ, Coll Engn, Dept Elect Engn, Baghdad, Iraq
[4] Univ Sains Malaysia, Sch Elect & Elect Engn, Nibong Tebal 14300, Penang, Malaysia
来源
5TH INTERNATIONAL CONFERENCE ON RECENT ADVANCES IN MATERIALS, MINERALS AND ENVIRONMENT (RAMM) & 2ND INTERNATIONAL POSTGRADUATE CONFERENCE ON MATERIALS, MINERAL AND POLYMER (MAMIP) | 2016年 / 19卷
关键词
RF sputtering; multilayer; Optical and Electrical properties; OPTICAL-PROPERTIES; FILMS; SILVER;
D O I
10.1016/j.proche.2016.03.011
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Study of ZnO / Cu / ZnO multilayer film stack using Cu film as a sandwich layer, in order to improve the overall performance of the transparent conductive film, structural, electrical and optical properties. ZnO / Cu / ZnO multilayer films prepared at room temperature by a DC and RF magnetron sputtering technique. The results showed that ZnO / Cu / ZnO multilayer film has good crystalline properties. With an increasing Cu layer thickness, a visible light transmittance of the multilayer film is reduced, while the electrical performance improved significantly. In the Cu layer thickness of 20 nm, ZnO / Cu / ZnO multilayer film optoelectronic integrated for optimal performance (C) 2016 The Authors. Published by Elsevier B.V.
引用
收藏
页码:38 / 44
页数:7
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