Determination of phase-shift from two fringe patterns using windowed Fourier ridges

被引：0

作者：

Kemao, Q ^{[1
]}

Soon, SH ^{[1
]}

Asundi, A ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Comp Engn, Singapore 639798, Singapore

来源：

THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS AND THIRD CONFERENCE OF THE ASIAN-COMMITTEE-ON-EXPERIMENTAL-MECHANICS, PTS 1AND 2 | 2005年 / 5852卷

关键词：

phase-shifting interferometry; phase-shift; windowed Fourier ridges;

D O I：

10.1117/12.621484

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In phase-shifting interferometry, it is important yet difficult to determine the phase-shift accurately. A windowed Fourier ridges approach is proposed which is able to obtain the phase-shift from two consecutive fringe patterns.

引用

页码：175 / 178

页数：4

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