Photoluminescence close to V-shaped pits in the quantum wells and enhanced output power for InGaN light emitting diode

被引:13
作者
Han, Dan [1 ,2 ]
Ma, Shufang [3 ]
Jia, Zhigang [1 ,2 ]
Jia, Wei [1 ,2 ]
Liu, Peizhi [1 ,2 ]
Dong, Hailiang [1 ,2 ]
Shang, Lin [3 ]
Zhang, Aiqin [1 ,2 ]
Zhai, Guangmei [1 ,2 ]
Li, Xuemin [1 ,2 ]
Liu, Xuguang [1 ,2 ]
Xu, Bingshe [1 ,2 ,3 ]
机构
[1] Taiyuan Univ Technol, Minist Educ, Key Lab Interface Sci & Engn Adv Mat, Taiyuan 030024, Shanxi, Peoples R China
[2] Taiyuan Univ Technol, Res Ctr Adv Mat Sci & Technol, Taiyuan 030024, Shanxi, Peoples R China
[3] Shaanxi Univ Sci & Technol, Inst Atom & Mol Sci, Xian 710021, Shaanxi, Peoples R China
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
semiconductor materials; light-emitting diodes; V-shaped pits; HOLE INJECTION; TEMPERATURE; DEPENDENCE; SAPPHIRE; EPITAXY; LAYER;
D O I
10.1088/1361-6463/aa8ec8
中图分类号
O59 [应用物理学];
学科分类号
摘要
Unlike the typical 'S-shaped' temperature dependent behavior for InGaN/GaN light emitting diodes (LEDs), the emission of the c-plane MQWs (C-QWs) close to V-shaped pits (V-pits) broadens across the short-wavelength band and exhibits a blue-shift as temperature increases by temperature-dependent micro photoluminescence (mu-TDPL). The phenomenon can be mainly attributed to a higher proportion carriers generate high-energy radiative transition in C-QWs close to V-pits because of augmented carrier mobility, in which the mechanism of carriers absorbed in sidewall MQWs (S-QWs) move to the C-QWs close to V-pits acts as a significant process. The sizes of V-pits can be enlarged as increasing the thickness of low temperature GaN interlayer (LT-GaN interlayer), leading to improved output power for LEDs.
引用
收藏
页数:7
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