Electric charge 3-dimensional profile measurement in dielectrics using acoustic microscope probe head

被引：1
|
作者：
Qin, XK [1 ]
Suzuki, K [1 ]
Sazaki, M [1 ]
Tanaka, Y [1 ]
Takada, T [1 ]
机构：
[1] Tongji Univ, Pohl Inst Solid State Phys, Shanghai 200092, Peoples R China
来源：
PROCEEDINGS OF THE 1998 IEEE INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS - ICSD '98 | 1998年
关键词：
D O I：
10.1109/ICSD.1998.709216
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：13 / 16
页数：4
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