Optical and electrical properties of ZnOCdTe thin films

被引:0
作者
Augelli, V
Ligonzo, T
Pizzichetti, A
Quaranta, F
Schiavulli, L
Valentini, A
机构
[1] UNITA INFM,I-70126 BARI,ITALY
[2] UNIV LECCE,DIPARTIMENTO SCI MAT,CNR,IME,I-73100 LECCE,ITALY
来源
ADVANCES IN CRYSTAL GROWTH | 1996年 / 203卷
关键词
optical transmission; x-ray diffraction; conductivity; thin films;
D O I
10.4028/www.scientific.net/MSF.203.267
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Films of ZnOCdTe have been deposited by reactive sputtering using as starting materials CdTe crystalline powder spreaded on a ZnO target and covering a fraction of the target area. The I composition of the sputtering gas was, respectively, 100% Ar, 10% H-2/Ar, 20% H-2/Ar. Films deposited in different conditions have been characterized from a structural, optical and electrical point of view. Three different series of samples have been investigated with different percentage of CdTe (10%, 30% and 60% of the target area covered by CdTe powder) and different composition of the sputtering gas. X-ray diffraction evidences a polycrystalline structure for samples deposited with 10% and 30% of CdTe and an amorphous structure for samples deposited with 60% of CdTe. Optical transmission measurements evidence a dependence of absorption coefficient on the percentage of hydrogen in the gas sputtering mixture. Dark conductivity has been measured as a function of temperature in the range 20 K- 300 K. More than one mechanism seem to contribute to electrical transport.
引用
收藏
页码:267 / 271
页数:5
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