Cu6Sn5 intermetallic: Reconciling composition and crystal structure

被引:18
|
作者
Leineweber, A. [1 ]
Wieser, C. [1 ,2 ]
Huegel, W. [2 ]
机构
[1] Tech Univ Bergakad Freiberg, Inst Mat Sci, D-09599 Freiberg, Germany
[2] Robert Bosch GmbH, Automot Elect Engn Assembly Interconnect Technol, Robert Bosch Str 2, D-71701 Schweberdingen, Germany
关键词
Cu6Sn5; Soldering; Order-disorder transformations; Incommensurate structures; PHASE-TRANSFORMATIONS; NI;
D O I
10.1016/j.scriptamat.2020.03.020
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Cu6Sn5 is the most prominent intermetallic compound developing upon soldering Cu-containing base materials with typical Sn-based lead-free solders. The order-disorder transition occurring at 430-490 K and the possibly associated build-up of stresses is regarded as relevant for reliability of solder joints. In the present work, contradictory reports on the crystal structures and actual composition of the Cu6Sn5 intermetallic are explained by composition-dependent occurrence of the "classical" commensurately ordered eta' phase and of an incommensurately ordered, more Cu-rich eta phase. The previously reported eta(8)-Cu5Sn4 and eta(4+1)-Cu46Sn37 structures with different unit cells and symmetries are actually approximants of the eta phase. (C) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:66 / 70
页数:5
相关论文
共 50 条
  • [31] Effect of Au Doping on Elastic, Thermodynamic, and Electronic Properties of η-Cu6Sn5 Intermetallic
    Lin, Xiang
    Zhang, Weiwei
    Mao, Zhuo
    Tian, Yali
    Jian, Xiaodong
    Zhou, Wei
    Wu, Ping
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (05) : 3031 - 3038
  • [32] Effect of Sn Grain Orientation on Formation of Cu6Sn5 Intermetallic Compound Under Current Stressing
    Chen, Ming-Yao
    Lin, Han-wen
    Chen, Chih
    JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (04) : 2179 - 2184
  • [33] Fracture toughness of intermetallic Cu6Sn5 in lead-free solder microelectronics
    Philippi, Bastian
    Matoy, Kurt
    Zechner, Johannes
    Kirchlechner, Christoph
    Dehm, Gerhard
    SCRIPTA MATERIALIA, 2016, 123 : 38 - 41
  • [34] Effect of Sn Grain Orientation on Formation of Cu6Sn5 Intermetallic Compound Under Current Stressing
    Ming-Yao Chen
    Han-wen Lin
    Chih Chen
    Journal of Electronic Materials, 2017, 46 : 2179 - 2184
  • [35] Nanoindentation creep on Cu3Sn, Cu6Sn5 and (Cu, Ni)6Sn5 intermetallic compounds grown in electrodeposited multilayered thin film
    Haseeb, A. S. M. A.
    Rahman, Abu Zayed Mohammad Saliqur
    Chia, Pay Ying
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 29 (02) : 1258 - 1263
  • [36] Effects of bulk Cu6Sn5 intermetallic compounds on the properties of Sn-Ag-Cu-Ce soldered joints
    Zhang, Liang
    Xue, Song-bai
    Gao, Li-li
    Sheng, Zhong
    Dai, Wei
    Ji, Feng
    Ye, Huan
    Chen, Yan
    Yu, Sheng-lin
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2011, 23 (01) : 4 - 9
  • [37] Effect of Au Doping on Elastic, Thermodynamic, and Electronic Properties of η-Cu6Sn5 Intermetallic
    Xiang Lin
    Weiwei Zhang
    Zhuo Mao
    Yali Tian
    Xiaodong Jian
    Wei Zhou
    Ping Wu
    Journal of Electronic Materials, 2020, 49 : 3031 - 3038
  • [38] Nanoindentation creep on Cu3Sn, Cu6Sn5 and (Cu, Ni)6Sn5 intermetallic compounds grown in electrodeposited multilayered thin film
    A. S. M. A. Haseeb
    Abu Zayed Mohammad Saliqur Rahman
    Pay Ying Chia
    Journal of Materials Science: Materials in Electronics, 2018, 29 : 1258 - 1263
  • [39] Mechanism and control of preferred Cu6Sn5 growth on single crystal (001)Cu
    H. R. Ma
    C. Dong
    J. Chen
    Y. P. Wang
    X. G. Li
    H. T. Ma
    Journal of Materials Science: Materials in Electronics, 2020, 31 : 5966 - 5974
  • [40] Mechanism and control of preferred Cu6Sn5 growth on single crystal (001)Cu
    Ma, H. R.
    Dong, C.
    Chen, J.
    Wang, Y. P.
    Li, X. G.
    Ma, H. T.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2020, 31 (08) : 5966 - 5974