Conducting Si-doped γ-Ga2O3 epitaxial films grown by pulsed-laser deposition

被引:47
作者
Oshima, Takayoshi [1 ]
Matsuyama, Keitaro [1 ]
Yoshimatsu, Kohei [1 ]
Ohtomo, Akira [1 ,2 ]
机构
[1] Tokyo Inst Technol, Dept Appl Chem, Meguro Ku, Tokyo 1528552, Japan
[2] Tokyo Inst Technol, Mat Res Ctr Element Strategy MCES, Midori Ku, Yokohama, Kanagawa 2268503, Japan
关键词
Doping; Pulsed-laser deposition; gamma-Ga2O3; Semiconducting gallium compounds; BETA-GA2O3; SINGLE-CRYSTALS; THIN-FILMS;
D O I
10.1016/j.jcrysgro.2015.04.011
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We report structural, electrical, and optical properties of Si doped gamma-Ga2O3 films epitaxially grown on (100) MgAl2O4 substrate by pulsed-laser deposition. The gamma-Ga2O3:Si films of a metastable spinet phase had neither secondary phase nor rotation domain. A highly doped film exhibited n-type conductivity with a carrier concentration of 1.8 x 10(19) cm(-3) and a Hall mobility of 1.6 cm(2) V-1 s(-1) at 300 K. Donor activation energy was estimated to be less than 7 meV from nearly temperature-independent transport Properties down to 77 K. The successful impurity doping indicates that gamma-Ga2O3 can be used as an n-type wide-band-gap semiconductor. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:23 / 26
页数:4
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