Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

被引：15

作者：

Costa, ACM

Anjos, MJ

Moreira, S

Lopes, RT

de Jesus, EFO

机构：

[1] Fed Univ Rio De Janeiro, COPPE, Nucl Instrumentat Lab, Rio De Janeiro, Brazil

[2] Fed Univ Rio De Janeiro, Inst Phys, BR-21941 Rio De Janeiro, Brazil

[3] State Univ Campinas, Civil Engn Coll, Campinas, SP, Brazil

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2003年 / 58卷 / 12期

关键词：

TXRF; mineral water; trace elements; synchrotron radiation;

D O I：

10.1016/j.sab.2003.07.002

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The total reflection X-ray fluorescence using synchrotron radiation (SRTXRF) has become a competitive technique for the determination of trace elements in samples that the concentrations are lower than 100 ng ml(-1). In this work, thirty-seven mineral waters commonly available in supermarkets of Rio de Janeiro, Brazil, were analyzed by SRTXRE The measurements were performed at the X-Ray Fluorescence Beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, Sao Paulo, using a polychromatic beam with maximum energy of 20 keV for the excitation. Standard solutions with gallium as internal standard were prepared for calibration of the system. Mineral water samples of 10 mu1 were added to Perspex sample carrier, dried under infrared lamp and analyzed for 200 s measuring time. It was possible to determine the concentrations of the following elements: Si, S, K, Ca, Ti, Cr, Mn, Ni, Cu, Zn, Ge, Rb, Sr, Ba and Pb. The elemental concentration values were compared with the limits established by the Brazilian legislation. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：2199 / 2204

页数：6

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