Enhanced efficiency of quantum dot light-emitting diode by sol-gel derived Zn1-xMgxO electron transport layer

被引:31
作者
Chrzanowski, M. [1 ]
Kuchowicz, M. [2 ,3 ]
Szukiewicz, R. [2 ,3 ]
Sitarek, P. [1 ]
Misiewicz, J. [1 ]
Podhorodecki, A. [1 ]
机构
[1] Wroclaw Univ Sci & Technol, Dept Expt Phys, Wyb Wyspianskiego 27, PL-50370 Wroclaw, Poland
[2] PORT Polish Ctr Technol Dev, LUKASIEWICZ Res Network, Stablowicka 147, PL-54066 Wroclaw, Poland
[3] Univ Wroclaw, Inst Expt Phys, Maxa Borna 9, PL-50204 Wroclaw, Poland
关键词
Sol-gel process; Doped zinc oxide; Electron transport layer; Quantum dot; Light-emitting diode; ZNO THIN-FILMS; OPTICAL-PROPERTIES; OXIDE; PERFORMANCE; CHEMISTRY; CELLS;
D O I
10.1016/j.orgel.2020.105656
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, sol-gel derived Zn1-xMgxO (ZMO) is proposed as an electron transport layer (ETL) for solution-processed quantum-dot light-emitting diodes (QLEDs). It is demonstrated that the increase of Mg content in Zn1-xMgxO films from 0% to 20% causes a dramatic suppression of electron current, which is attributed to the lifting of conduction band minimum and reduction of electron mobility. As a result of Mg-doping, the charge carrier balance might be achieved in the QLED with the Zn0.85Mg0.15O layer resulting in maximum external quantum efficiency of 5.74% and current efficiency of 18 cd A(-1), which are over 3-fold higher than in the case of the device with ZnO layer. Improved device performance is further explained by reduced exciton quenching at QDs/ZMO interface, which is confirmed by time-resolved PL experiments. Obtained results indicate that sol-gel derived ZMO is a promising candidate for ETL in quantum-dot based optoelectronic devices.
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页数:7
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