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Stability of the Si-H bond on the hydrogen-terminated Si(111) surface studied by sum frequency generation
被引:35
作者:
Ye, S
Saito, T
Nihonyanagi, S
Uosaki, K
[1
]
Miranda, PB
Kim, D
Shen, YR
机构:
[1] Hokkaido Univ, Grad Sch Sci, Div Chem, Phys Chem Lab, Sapporo, Hokkaido 0600810, Japan
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
关键词:
sum frequency generation;
desorption induced by photon stimulation;
photochemistry;
silicon;
low index single crystal surfaces;
hydrogen atom;
solid-gas interfaces;
D O I:
10.1016/S0039-6028(01)00690-2
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Stability of the Si-H bonds on the hydrogen-terminated Si(111) surface has been investigated by sum frequency generation (SFG) spectroscopy in air at room temperature. The SFG observation showed that the Si(111) surface is terminated by a monolayer of monohydride (W-H) after etching in a concentrated ammonium fluoride (NH4F) solution. The number of Si-H bonds decreased with laser irradiation time and the abstraction rate of hydrogen atoms on Si increased with the increase of input energy of "visible" light. The Si-H bond under irradiation at 1064 nm light was more stable than that at 532 nm light with a given intensity. A small amount of water in air severely lowered the stability of Si-H bond because of a photoelectrochemical reaction under laser irradiation. (C) 2001 Elsevier Science B.V. All rights reserved.
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页码:121 / 128
页数:8
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