Novel Micro Scanning with Integrated Atomic Force Microscope and Confocal Laser Scanning Microscope

被引:0
|
作者
Chou, Meng-Hao [1 ]
Huang, Ching-Chi [1 ]
Liu, Yi-Lin
Chen, Huang-Chih [1 ]
Fu, Li-Chen [1 ]
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan
来源
2019 3RD IEEE CONFERENCE ON CONTROL TECHNOLOGY AND APPLICATIONS (IEEE CCTA 2019) | 2019年
关键词
Atomic force microscope (AFM); confocal laser scanning microscope (CLSM); variable speed scanning; adaptive scanning range; regions of interest (ROI);
D O I
10.1109/ccta.2019.8920500
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Integrated atomic force microscope (AFM) and confocal laser scanning microscope (CLSM) can quickly obtain the three-dimensional (3-D) surface of the sample in large scanning range and recover the region of interesting (ROI) in nanoscale resolution. However, the traditional cooperative algorithm for integrated microscopes occupies too much scanning time. In this work, we develop a novel cooperative algorithm for the integrated microscopes to reduce scanning time of AFM and achieve higher scanning speed. First, the calibration of the microscopes will be implemented. Next, CLSM starts a large range scan first and then define the region of interesting (ROI) by edge detection. And then, the scan regions of the AFM are arranged based on the ROI and adaptive scanning region method is proposed to reduce the scanning time. Furthermore, variable speed scanning based on the height information obtained from CLSM image is applied to increase the AFM scanning speed. Finally, the scanning images obtained from AFM and CLSM are merged together. A series of experimental results show that proposed cooperative algorithm can save approximately 69.2% of scanning time compared with that obtained by traditional cooperative algorithm.
引用
收藏
页码:911 / 916
页数:6
相关论文
共 1 条
  • [1] An On-line Scanning Time Allocation based Variable Speed Scanning Method for Atomic Force Microscopies
    Ren, Xiao
    Fang, Yongchun
    Lu, Han
    Wu, Yinan
    2015 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO), 2015, : 245 - 250