Cu2ZnSnS4 thin-film solar cell absorbers illuminated by soft x-rays

被引：8

作者：

Baer, M. ^{[1
,2
,3
]}

Schubert, B. -A. ^{[1
]}

Marsen, B. ^{[1
]}

Wilks, R. G. ^{[1
]}

Blum, M. ^{[3
,4
]}

Krause, S. ^{[3
]}

Pookpanratana, S. ^{[3
]}

Zhang, Y. ^{[3
,5
]}

Unold, T. ^{[1
]}

Yang, W. ^{[4
]}

Weinhardt, L.

Heske, C. ^{[3
]}

Schock, H. -W. ^{[1
]}

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie GmbH HZB, Solar Energy Res, D-14109 Berlin, Germany

[2] Brandenburg Tech Univ Cottbus, Inst Phys & Chem, D-03046 Cottbus, Germany

[3] Univ Nevada, Dept Chem, Las Vegas, NV 89154 USA

[4] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA

[5] Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China

来源：

JOURNAL OF MATERIALS RESEARCH | 2012年 / 27卷 / 08期

关键词：

PERFORMANCE;

D O I：

10.1557/jmr.2012.59

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In view of the complexity of thin-film solar cells, which are comprised of a multitude of layers, interfaces, surfaces, elements, impurities, etc., it is crucial to characterize and understand the chemical and electronic structure of these components. Because of the high complexity of the Cu2ZnSn(S,Se)(4) compound semiconductor absorber material alone, this is particularly true for kesterite-based devices. Hence, this paper reviews our recent progress in the characterization of Cu2ZnSnS4 (CZTS) thin films. It is demonstrated that a combination of different soft x-ray spectroscopies is an extraordinarily powerful method for illuminating the chemical and electronic material characteristics from many different perspectives, ultimately resulting in a comprehensive picture of these properties. The focus of the article will be on secondary impurity phases, electronic structure, native oxidation, and the CZTS surface composition.

引用

页码：1097 / 1104

页数：8

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