Macroscopic Superconducting Current through a Silicon Surface Reconstruction with Indium Adatoms: Si(111)-(√7 X √3)-In

被引:155
作者
Uchihashi, Takashi [1 ]
Mishra, Puneet [1 ]
Aono, Masakazu [1 ]
Nakayama, Tomonobu [1 ]
机构
[1] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton, Tsukuba, Ibaraki 3050044, Japan
关键词
2-DIMENSIONAL LIMIT; METAL; TRANSITIONS; FILMS;
D O I
10.1103/PhysRevLett.107.207001
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Macroscopic and robust supercurrents are observed by direct electron transport measurements on a silicon surface reconstruction with In adatoms [Si(111)-(root 7 X root 3)-In]. The superconducting transition manifests itself as an emergence of the zero resistance state below 2.8 K. I-V characteristics exhibit sharp and hysteretic switching between superconducting and normal states with well-defined critical and retrapping currents. The two-dimensional (2D) critical current density J(2D,c) is estimated to be as high as 1.8 A/m at 1.8 K. The temperature dependence of J(2D,c) indicates that the surface atomic steps play the role of strongly coupled Josephson junctions.
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页数:4
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