Effects of Si doping in the barriers on the optical properties of In0.15Ga0.85N/In0.015 Ga0.985N multiple quantum wells

被引:2
|
作者
Ryu, MY [1 ]
Yu, YJ
Yu, PW
Shin, EJ
Lee, JI
Yu, SK
Oh, ES
Nam, OH
Sone, CS
Park, YJ
机构
[1] Kwangju Inst Sci & Technol, Dept Informat & Commun, Kwangju 500712, South Korea
[2] Korea Res Inst Stand & Sci, Optoelect Grp, Taejon 305600, South Korea
[3] Samsung Adv Inst Technol, Compound Semicond Lab, Suwon 440600, South Korea
关键词
D O I
10.3938/jkps.37.989
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We studied the effects of Si doping on the optical properties of In0.15Ga0.85N/In0.015Ga0.985N multiple quantum wells (MQWs) by using photoluminescence (PL) and time-resolved PL measurements. The Si doping concentration in the In0.015Ga0.985N barriers was varied from 2 x 10(18) to 1 x 10(19) cm(-3). As the Si doping was increased, the PL showed an increase in the emission intensity and a blueshift of the peak energy. The temporal behavior of the PL was also studied. The 10-K recombination lifetime depended strongly on the Si doping level in the InGaN barriers, decreasing from similar to 80 ns to similar to 20 ns as the doping level increased from 2 x 10(18) to 1 x 10(19) cm(-3). The emission peaks shifted towards lower energy as time evolved.
引用
收藏
页码:989 / 992
页数:4
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