Growth behavior and intrinsic properties of vapor-deposited iron palladium thin films

被引:37
作者
Kock, I. [1 ]
Edler, T. [1 ]
Mayr, S. G. [1 ]
机构
[1] Univ Gottingen, Inst Phys 1, D-37077 Gottingen, Germany
关键词
D O I
10.1063/1.2875306
中图分类号
O59 [应用物理学];
学科分类号
摘要
Iron palladium based alloys are promising candidates to realize miniaturized magnetic shape memory devices on a thin film basis and also bear interesting magnetic properties, particularly for the area of magnetic recording. To address the impact of growth conditions on physical properties, thin vapor-deposited Fe70Pd30 films are analyzed with respect to structure, texture, and stress as a function of processing parameters. We find that deposition at room temperature leads to a bct structure, while deposition at elevated temperature as well as annealing results in austenitic films in the fcc phase, which is desirable for magnetic shape memory applications. (c) 2008 American Institute of Physics.
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页数:3
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共 20 条
[1]   MEASUREMENTS OF THE INTRINSIC STRESS IN THIN METAL-FILMS [J].
ABERMANN, R .
VACUUM, 1990, 41 (4-6) :1279-1282
[2]   STRESSES AND DEFORMATION PROCESSES IN THIN-FILMS ON SUBSTRATES [J].
DOERNER, MF ;
NIX, WD .
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1988, 14 (03) :225-268
[3]   STRESSES IN THIN-FILMS - RELEVANCE OF GRAIN-BOUNDARIES AND IMPURITIES [J].
HOFFMAN, RW .
THIN SOLID FILMS, 1976, 34 (02) :185-190
[4]   Shape memory behavior of Fe-Pd alloy thin films prepared by dc magnetron sputtering [J].
Inoue, S ;
Inoue, K ;
Koterazawa, K ;
Mizuuchi, K .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 339 (1-2) :29-34
[5]   Magnetostriction of martensite [J].
James, RD ;
Wuttig, M .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1998, 77 (05) :1273-1299
[6]  
KOCK I, 2007, THESIS U GOTTINGEN, P32503
[7]  
MAYR S, 2002, ENCY MAT SCI TECHNOL, P32503
[8]   Identification of key parameters by comparing experimental and simulated growth of vapor-deposited amorphous Zr65Al7.5Cu27.5 films [J].
Mayr, SG ;
Moske, M ;
Samwer, K .
PHYSICAL REVIEW B, 1999, 60 (24) :16950-16955
[9]   Model for intrinsic stress formation in amorphous thin films [J].
Mayr, SG ;
Samwer, K .
PHYSICAL REVIEW LETTERS, 2001, 87 (03) :361051-361054
[10]   Surface morphology, stress, and volume change during growth and crystallization of interface-stabilized amorphous Fe100-xZrx films -: art. no. 115408 [J].
Mayr, SG ;
Samwer, K .
PHYSICAL REVIEW B, 2002, 65 (11) :1154081-1154087