Linearity in calibration: Quantifying non-linearity, Part II

被引:0
|
作者
Mark, H [1 ]
Workman, J
机构
[1] Mark Electr, Suffern, NY 10901 USA
[2] Thermo Electron Corp, Waltham, MA 02454 USA
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D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
At this point in our series dealing with linearity, we have determined that the data under investigation do indeed show a statistically significant amount of nonlinearity, and we have developed a way of characterizing the amount of nonlinearity, independent of the scale of either variable, and even independent of the data itself.
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页码:44 / +
页数:8
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