Precipitation and coarsening of bismuth plates in Sn-Ag-Cu-Bi and Sn-Cu-Ni-Bi solder joints

被引:27
作者
Belyakov, S. A. [1 ]
Xian, J. [1 ]
Zeng, G. [1 ]
Sweatman, K. [2 ]
Nishimura, T. [2 ]
Akaiwa, T. [2 ]
Gourlay, C. M. [1 ]
机构
[1] Imperial Coll, Dept Mat, London SW7 2AZ, England
[2] Nihon Super Co Ltd, NS Bldg, Suita, Osaka 5640063, Japan
基金
英国工程与自然科学研究理事会;
关键词
CRACK-GROWTH-BEHAVIOR; MECHANICAL-PROPERTIES; PB; NUCLEATION; DIFFUSION; TIN; KINETICS; PHASE; MICROSTRUCTURES; ALLOYS;
D O I
10.1007/s10854-018-0302-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years there has been increased interest in Bi-containing solders to improve the reliability of electronics and drive down processing temperatures. When the Bi content is more than similar to 2wt% in Sn-Ag-Cu-Bi and Sn-Cu-Ni-Bi solders, (Bi) phase forms by a non-equilibrium eutectic reaction and also precipitates in the solid state. Here, we study the development of bismuth plates during room temperature storage in a range of Bi-containing solders. It is shown that Bi plates precipitate with one of two (Bi)-Sn orientation relationships (ORs). During coarsening the OR with the better lattice match grows at the expense of the other, leading to a single OR. The plate coarsening kinetics scale with the cube root of holding time and are relatively rapid, with plates exceeding 1 mu m in length within 1 day at room temperature. Prolonged room temperature storage of more than 1year resulted in Bi accumulation in 5-20 mu m (Bi) particles at Sn grain boundaries.
引用
收藏
页码:378 / 390
页数:13
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