Cyclotron-resonance harmonics in the ac response of a 2D electron gas with smooth disorder

被引:162
作者
Dmitriev, IA [1 ]
Mirlin, AD
Polyakov, DG
机构
[1] Forschungszentrum Karlsruhe, Inst Nanotechnol, D-76021 Karlsruhe, Germany
[2] Univ Karlsruhe, Inst Theorie Kondensierten Mat, D-76128 Karlsruhe, Germany
[3] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[4] Leningrad Nucl Phys Inst, St Petersburg 188350, Russia
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1103/PhysRevLett.91.226802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The frequency-dependent conductivity sigma(xx)(omega) of 2D electrons subjected to a transverse magnetic field and smooth disorder is calculated. The interplay of Landau quantization and disorder scattering gives rise to an oscillatory structure that survives in the high-temperature limit. The relation to recent experiments on photoconductivity by Zudov et al. and Mani et al. is discussed.
引用
收藏
页数:4
相关论文
共 23 条
[1]  
ABSTREITER G, 1976, PHYS REV B, V14, P2480, DOI 10.1103/PhysRevB.14.2480
[2]  
ALEINER IL, COMMUNICATION
[3]  
ANDERSON PW, CONDMAT0302129
[4]   ELECTRONIC-PROPERTIES OF TWO-DIMENSIONAL SYSTEMS [J].
ANDO, T ;
FOWLER, AB ;
STERN, F .
REVIEWS OF MODERN PHYSICS, 1982, 54 (02) :437-672
[5]   THEORY OF CYCLOTRON-RESONANCE LINESHAPE IN A 2-DIMENSIONAL ELECTRON-SYSTEM [J].
ANDO, T .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1975, 38 (04) :989-997
[6]   LOW-FIELD TRANSPORT-COEFFICIENTS IN GAAS/GA1-XALXAS HETEROSTRUCTURES [J].
COLERIDGE, PT ;
STONER, R ;
FLETCHER, R .
PHYSICAL REVIEW B, 1989, 39 (02) :1120-1124
[7]   Classical mechanism for negative magnetoresistance in two dimensions [J].
Dmitriev, A ;
Dyakonov, M ;
Jullien, R .
PHYSICAL REVIEW B, 2001, 64 (23)
[8]  
DMITRIEV IA, IN PRESS
[9]   Radiation-induced magnetoresistance oscillations in a 2D electron gas [J].
Durst, AC ;
Sachdev, S ;
Read, N ;
Girvin, SM .
PHYSICAL REVIEW LETTERS, 2003, 91 (08)
[10]   SUBHARMONIC STRUCTURE OF CYCLOTRON-RESONANCE IN AN INVERSION LAYER ON SI [J].
KOTTHAUS, JP ;
ABSTREITER, G ;
KOCH, JF .
SOLID STATE COMMUNICATIONS, 1974, 15 (03) :517-519