Secondary electron emission properties

In this paper an introduction is given to secondary electron emission properties. It is shown that the reduced secondary emission yield delta/delta(m) as a function of the reduced primary energy E-p/E-m can be described by a universal curve. It is found that it is easier to use the measurement of the maximum secondary electron emission delta(m) and the energy E-m at which this maximum is reached to determine the suitability of a coating for use in the display than direct measurement of the first crossover energy E-I. The value of delta(m) and E-m can be used to derive E-I. Furthermore, it is observed that in any material the elastic fraction of the secondary electrons exhibits a universal behaviour as a function of E-p. Fits to delta(E-p) and the energy distribution of the secondary electrons are proposed which can be used in Monte Carlo simulations.