Scanning gate microscopy of a nanostructure where electrons interact

被引：16

作者：

Freyn, Axel ^{[1
]}

Kleftogiannis, Ioannis ^{[1
]}

Pichard, Jean-Louis ^{[1
]}

机构：

[1] CEA, IRAMIS, Serv Phys Etat Condense, CNRS URA 2462, F-91191 Gif Sur Yvette, France

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 100卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.100.226802

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We show that scanning gate microscopy can be used for probing electron-electron interactions inside a nanostructure. We assume a simple model made of two noninteracting strips attached to an interacting nanosystem. In one of the strips, the electrostatic potential can be locally varied by a charged tip. This change induces corrections upon the nanosystem Hartree-Fock self-energies which enhance the fringes spaced by half the Fermi wavelength in the images giving the quantum conductance as a function of the tip position.

引用

页数：4

共 14 条

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