Additional Electrochemical Treatment Effects on the Switching Characteristics of Anodic Porous Alumina Resistive Switching Memory

被引:7
作者
Otsuka, Shintaro [1 ]
Takeda, Ryouta [1 ]
Furuya, Saeko [1 ]
Shimizu, Tomohiro [2 ]
Shingubara, Shouso [2 ]
Iwata, Nobuyuki [1 ]
Watanabe, Tadataka [1 ]
Takano, Yoshiki [1 ]
Takase, Kouichi [1 ]
机构
[1] Nihon Univ, Coll Sci & Technol, Tokyo 1018308, Japan
[2] Kansai Univ, Grad Sch Engn, Suita, Osaka 5648680, Japan
关键词
FILMS; RERAM;
D O I
10.1143/JJAP.51.06FF11
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the current-voltage characteristics of a resistive switching memory (ReRAM), especially the reproducibility of the switching voltage between an insulating state and a metallic state. The poor reproducibility hinders the practical use of this memory. According to a filament model, the variation of the switching voltage may be understood in terms of the random choice of filaments with different conductivities and lengths at each switching. A limitation of the number of conductive paths is expected to lead to the suppression of the variation of switching voltage. In this study, two strategies for the limitation have been proposed using an anodic porous alumina (APA). The first is the reduction of the number of conductive paths by restriction of the contact area between the top electrodes and the insulator. The second is the lowering of the resistivity of the insulator, which makes it possible to grow filaments with the same characteristics by electrochemical treatments using a pulse-electroplating technique. (C) 2012 The Japan Society of Applied Physics
引用
收藏
页数:4
相关论文
共 50 条
[41]   Robust mica perovskite photoelectric resistive switching memory [J].
Zhang, Guanglei ;
Xu, Yanqing ;
Yang, Shuai ;
Ren, Shuxia ;
Jiao, Yinan ;
Wang, Ye ;
Ma, Xuena ;
Li, Hao ;
Hao, Weizhong ;
He, Caili ;
Liu, Xiaomin ;
Zhao, Jinjin .
NANO ENERGY, 2023, 106
[42]   Nonvolatile resistive switching memory based on amorphous carbon [J].
Zhuge, F. ;
Dai, W. ;
He, C. L. ;
Wang, A. Y. ;
Liu, Y. W. ;
Li, M. ;
Wu, Y. H. ;
Cui, P. ;
Li, Run-Wei .
APPLIED PHYSICS LETTERS, 2010, 96 (16)
[43]   Effect of Interface Layer Engineering on Resistive Switching Characteristics of ZrO2-Based Resistive Switching Devices [J].
Li, Yingtao ;
Li, Xiaoyan ;
Fu, Liping ;
Chen, Rongbo ;
Wang, Hong ;
Gao, Xiaoping .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (12) :5390-5394
[44]   Improved resistive switching phenomena observed in SiNx-based resistive switching memory through oxygen doping process [J].
Park, Ju Hyun ;
Kim, Hee-Dong ;
Hong, Seok Man ;
Yun, Min Ju ;
Jeon, Dong Su ;
Kim, Tae Geun .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2014, 8 (03) :239-242
[45]   Accurate analysis of conduction and resistive-switching mechanisms in double-layered resistive-switching memory devices [J].
Lee, Jung-Kyu ;
Jung, Sunghun ;
Park, Jinwon ;
Chung, Sung-Woong ;
Roh, Jae Sung ;
Hong, Sung-Joo ;
Cho, Il Hwan ;
Kwon, Hyuck-In ;
Park, Chan Hyeong ;
Park, Byung-Gook ;
Lee, Jong-Ho .
APPLIED PHYSICS LETTERS, 2012, 101 (10)
[46]   Effect of electric field concentration using nanopeak structures on the current-voltage characteristics of resistive switching memory [J].
Otsuka, Shintaro ;
Shimizu, Tomohiro ;
Shingubara, Shoso ;
Makihara, Katsunori ;
Miyazaki, Seiichi ;
Yamasaki, Atsushi ;
Tanimoto, Yusuke ;
Takase, Kouichi .
AIP ADVANCES, 2014, 4 (08)
[47]   Effects of electrode materials on bipolar and unipolar switching in NiO resistive switching device [J].
Ma, Guokun ;
Tang, Xiaoli ;
Su, Hua ;
Zhang, Huaiwu ;
Li, Jie ;
Zhong, Zhiyong .
MICROELECTRONIC ENGINEERING, 2014, 129 :17-20
[48]   Resistive Switching in Amorphous GeSe-Based Resistive Random Access Memory [J].
Nam, Ki-Hyun ;
Kim, Jang-Han ;
Cho, Won-Ju ;
Kim, Chung-Hyeok ;
Chung, Hong-Bay .
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 16 (10) :10393-10396
[49]   Impact of graphene and single-layer BN insertion on bipolar resistive switching characteristics in tungsten oxide resistive memory [J].
Kim, Jongmin ;
Kim, Duhwan ;
Jo, Yongcheol ;
Han, Jaeseok ;
Woo, Hyeonseok ;
Kim, Hyungsang ;
Kim, K. K. ;
Hong, J. P. ;
Im, Hyunsik .
THIN SOLID FILMS, 2015, 589 :188-193
[50]   The effect of size on the resistive switching characteristics of NiO nanodots [J].
Ahn, Yoonho ;
Son, Jong Yeog .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2016, 99 :134-137