Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica

被引：4

作者：

Brovelli, S. ^{[1
]}

Chiodini, N. ^{[2
,3
]}

Lauria, A. ^{[2
,3
]}

Paleari, A. ^{[2
,3
]}

机构：

[1] UCL, Dept Phys & Astron, London Ctr Nanotechnol, London WC1E 6BT, England

[2] Univ Milano Bicocca, CNISM, I-20125 Milan, Italy

[3] Univ Milano Bicocca, Dipartimento Sci Mat, I-20125 Milan, Italy

来源：

JOURNAL OF NANOPARTICLE RESEARCH | 2008年 / 10卷 / 05期

关键词：

nanoparticles; small-angle neutron scattering; erbium doping; transmission microscopy; sol-gel; silica;

D O I：

10.1007/s11051-007-9302-y

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We show here what kind of modification of the interphase morphology of SnO2 nanoparticles in silica (average nanocrystal radius, (r) over cap approximate to 4nm in undoped material; (r) over cap approximate to 2 nm in erbium doped material) brings to the passivation of interfacial defects. Surface states, which may preclude the exploitation of UV excitonic emission, are reduced after doping by rare earth ions. We demonstrate, by means of transmission-electron-microscopy and small-angleneutronscattering data, that a smooth interphase with a non negligible thickness takes the place of the fractal and discontinuous boundary observed in undoped material.

引用

页码：737 / 743

页数：7

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