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Thermal relaxation of isolated silicon pyramids on the Si(100)2 x 1 surface
被引:6
|作者:
Ichimiya, A
[1
]
Suzuki, M
[1
]
Nishida, S
[1
]
机构:
[1] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词:
scanning tunneling microscopy;
surface diffusion;
silicon;
D O I:
10.1016/S0039-6028(01)01265-1
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Silicon mounds fabricated on the Si(1 0 0)2 x 1 surface by a tip of a scanning tunneling microscope (STM) have been observed by STM at substrate temperature of 770 K. The shape of the mound is a quadrangular pyramid with facets of regular array of steps with double layer height. For all the step, the dimer rows are perpendicular to the step edges, so called the D-B step. Just after the fabrication, the pyramid begins to decay immediately layer-by-layer. During decay, the D-B steps move scarcely, but only the S-B steps at the bottom layer move due to attachment and detachment of atoms which are detached from the upper layers. For a single layer mound, the aspect ratio of the mound oscillates between about 2.5 and 1.5. (C) 2001 Elsevier Science B.V. All rights reserved.
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页码:555 / 560
页数:6
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