Reduction of Leakage Currents in CdZnTe-Based X-ray and γ-ray Detectors: a II-VI Semiconductor Superlattice Approach

被引:0
|
作者
Chang, Y. [1 ]
Grein, C. H. [1 ]
Becker, C. R. [1 ]
Wang, X. J. [1 ]
Sivananthan, S. [1 ]
机构
[1] Univ Illinois, Microphys Lab, Dept Phys, Chicago, IL 60607 USA
来源
HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS XII | 2010年 / 7805卷
关键词
superlattice; cadmium zinc telluride; radiation detector; leakage current; RADIATION; TEMPERATURE; CD1-XZNXTE;
D O I
10.1117/12.862285
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An approach to the fabrication of CdZnTe-based heterojunction detectors is presented with the primary goal of reducing leakage currents, permitting increased bias voltages and therefore improving x-ray and gamma-ray detector performance. The p-i-n detector architecture is theoretically superior to traditional CdZnTe detectors, and our modeling predicts that superlattice contact layers result in leakage current reductions relative to bulk semiconductor contacts. The benefits arise because the superlattices can be designed to have large carrier effective masses along the electric field direction yet a density of states less than that of a comparable bulk semiconductor.
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页数:8
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