Fresnel drag in a resonant moving medium

被引：0

作者：

Bassani, F ^{[1
]}

Artoni, M ^{[1
]}

La Rocca, GC ^{[1
]}

Carusotto, I ^{[1
]}

机构：

[1] Scuola Normale Super Pisa, INFM, I-56126 Pisa, Italy

来源：

PROCEEDINGS OF THE 25TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, PTS I AND II | 2001年 / 87卷

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We discuss how the phase of a light plane-wave propagating in a resonant medium under electromagnetically induced transparency (EIT) is affected by the uniform motion of the medium. In a specific pump-probe EIT configuration the resonant probe beam experiences a phase-shift (Fresnel-Fizeau effect) that undergoes large variations, acquiring even vanishing values, due to the combined effects of the strong frequency dispersion and anisotropy induced by the pump beam. Detailed numerical simulations are presented based on the "yellow exciton" level scheme Of Cu2O.

引用

页码：85 / 86

页数：2

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