Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography

被引：17

作者：

Kuchibhatla, Satyanarayana V. N. T. ^{[1
,2
]}

Shutthanandan, V. ^{[1
]}

Prosa, T. J. ^{[3
]}

Adusumilli, P. ^{[1
,4
]}

Arey, B. ^{[1
]}

Buxbaum, A. ^{[5
]}

Wang, Y. C. ^{[5
]}

Tessner, T. ^{[5
]}

Ulfig, R. ^{[3
]}

Wang, C. M. ^{[1
]}

Thevuthasan, S. ^{[1
]}

机构：

[1] Pacific NW Natl Lab, EMSL, Richland, WA 99352 USA

[2] Battelle Sci & Technol India, Pune, MH, India

[3] Cameca Instruments Inc, Madison, WI USA

[4] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[5] FEI Co, Hillsboro, OR USA

来源：

NANOTECHNOLOGY | 2012年 / 23卷 / 21期

关键词：

EVAPORATION; MGO;

D O I：

10.1088/0957-4484/23/21/215704

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Analysis of nanoparticles is often challenging especially when they are embedded in a matrix. Hence, we have used laser-assisted atom probe tomography (APT) to analyze the Au nanoclusters synthesized in situ using ion-beam implantation in a single crystal MgO matrix. APT analysis along with scanning transmission electron microscopy and energy dispersive spectroscopy (STEM-EDX) indicated that the nanoparticles have an average size similar to 8-12 nm. While it is difficult to analyze the composition of individual nanoparticles using STEM, APT analysis can give three-dimensional compositions of the same. It was shown that the maximum Au concentration in the nanoparticles increases with increasing particle size, with a maximum Au concentration of up to 50%.

引用

页数：5

共 25 条

[1] Towards better 3-D reconstructions by combining electron tomography and atom-probe tomography [J].

Arslan, Ilke ;

Marquis, Emmanuelle A. ;

Homer, Mark ;

Hekmaty, Michelle A. ;

Bartelt, Norman C. .

ULTRAMICROSCOPY, 2008, 108 (12) :1579-1585

[2] Characterization challenges for nanomaterials [J].

Baer, D. R. ;

Amonette, J. E. ;

Engelhard, M. H. ;

Gaspar, D. J. ;

Karakoti, A. S. ;

Kuchibhatla, S. ;

Nachimuthu, P. ;

Nurmi, J. T. ;

Qiang, Y. ;

Sarathy, V. ;

Seal, S. ;

Sharma, A. ;

Tratnyek, P. G. ;

Wang, C. -M. .

SURFACE AND INTERFACE ANALYSIS, 2008, 40 (3-4) :529-537

[3] The problem with determining atomic structure at the nanoscale [J].

Billinge, Simon J. L. ;

Levin, Igor .

SCIENCE, 2007, 316 (5824) :561-565

[4] Laser-assisted atom probe tomography and nanosciences [J].

Blavette, Didier ;

Al Kassab, Talaat ;

Cadel, Emanuel ;

Mackel, Alexander ;

Vurpillot, Francois ;

Gilbert, Mathieu ;

Cojocaru, Oana ;

Deconihout, Bernard .

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2008, 99 (05) :454-460

[5] Application software for data analysis for three-dimensional atom probe microscopy [J].

Hellman, O ;

Vandenbroucke, J ;

du Rivage, JB ;

Seidman, DN .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 327 (01) :29-33

[6]

Hellman OC, 2000, MICROSC MICROANAL, V6, P437, DOI 10.1007/s100050010051

[7] Invited review article: Atom probe tomography [J].

Kelly, Thomas F. ;

Miller, Michael K. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03)

[8] Atom probe tomography of electronic materials [J].

Kelly, Thomas F. ;

Larson, David J. ;

Thompson, Keith ;

Alvis, Roger L. ;

Bunton, Joseph H. ;

Olson, Jesse D. ;

Gorman, Brian P. .

ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 (681-727) :681-727

[9] Structural analysis of a new precipitate phase in high-temperature TiNiPt shape memory alloys [J].

Kovarik, L. ;

Yang, F. ;

Garg, A. ;

Diercks, D. ;

Kaufman, M. ;

Noebe, R. D. ;

Mills, M. J. .

ACTA MATERIALIA, 2010, 58 (14) :4660-4673

[10] Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide [J].

Larde, R. ;

Talbot, E. ;

Vurpillot, F. ;

Pareige, P. ;

Schmerber, G. ;

Beaurepaire, E. ;

Dinia, A. ;

Pierron-Bohnes, V. .

JOURNAL OF APPLIED PHYSICS, 2009, 105 (12)

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