An Electromagnetic Compatibility Problem via Unscented Transform and Stochastic Collocation Methods

被引：0
作者：
Lallechere, S. [1 ,2 ]
Bonnet, P. [1 ,2 ]
El Baba, I. [1 ,2 ]
Paladian, F. [1 ,2 ]
机构：
[1] Clermont Univ, Univ Blaise Pascal, LASMEA, F-63000 Clermont Ferrand, France
[2] CNRS, UMR6602, LASMEA, F-63177 Aubiere, France
来源：
APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL | 2012年 / 27卷 / 02期
关键词：
Sensibility analysis; stochastic collocation; stochastic electromagnetic compatibility; unscented transform; EFFICIENT COMPUTATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper aims to illustrate the current interest about the use of stochastic techniques for electromagnetic compatibility (EMC) issues. This problem may be handled from various methods. First, we may focus on the Monte Carlo (MC) formalism but other techniques have been implemented more recently (the unscented transform, UT, or stochastic collocation, SC, for instance). This work deals with solving a stochastic EMC problem (transmission line) with the UT and SC techniques and to compare them with the reference MC results.
引用
收藏
页码：94 / 101
页数：8
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