CMOS Scaling for sub-90 nm to sub-10 nm

被引:13
作者
Iwai, H [1 ]
机构
[1] Tokyo Inst Technol, Frontier Collaborat Res Ctr, Midori Ku, Yokohama, Kanagawa 2268502, Japan
来源
17TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: DESIGN METHODOLOGIES FOR THE GIGASCALE ERA | 2004年
关键词
D O I
10.1109/ICVD.2004.1260899
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Recently, CMOS downsizing has been accelerated very aggressively in both production and reseach level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
引用
收藏
页码:30 / 35
页数:6
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