Field-effect devices utilizing LaAlO3-SrTiO3 interfaces

被引:112
作者
Foerg, B. [2 ]
Richter, C. [1 ,2 ]
Mannhart, J. [1 ]
机构
[1] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
[2] Univ Augsburg, Ctr Elect Correlat & Magnetism, D-86135 Augsburg, Germany
关键词
Lanthanum compounds - Aluminum compounds - Gate dielectrics;
D O I
10.1063/1.3682102
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using LaAlO3-SrTiO3 bilayers, we have fabricated field-effect devices that utilize the two-dimensional electron liquid generated at the bilayers' n-type interfaces as drain-source channels and the LaAlO3 layers as gate dielectrics. With gate voltages well below 1V, the devices are characterized by voltage gain and current gain. The devices were operated at temperatures up to 100 degrees C. (C) 2012 American Institute of Physics. [doi:10.1063/1.3682102]
引用
收藏
页数:3
相关论文
共 11 条
[1]   Electric field effect in correlated oxide systems [J].
Ahn, CH ;
Triscone, JM ;
Mannhart, J .
NATURE, 2003, 424 (6952) :1015-1018
[2]   Two-Dimensional Quantum Oscillations of the Conductance at LaAlO3/SrTiO3 Interfaces [J].
Caviglia, A. D. ;
Gariglio, S. ;
Cancellieri, C. ;
Sacepe, B. ;
Fete, A. ;
Reyren, N. ;
Gabay, M. ;
Morpurgo, A. F. ;
Triscone, J-M. .
PHYSICAL REVIEW LETTERS, 2010, 105 (23)
[3]   Oxide Nanoelectronics on Demand [J].
Cen, Cheng ;
Thiel, Stefan ;
Mannhart, Jochen ;
Levy, Jeremy .
SCIENCE, 2009, 323 (5917) :1026-1030
[4]   Electrical characterization of amorphous lanthanum aluminate thin films grown by molecular-beam deposition on silicon [J].
Edge, LF ;
Schlom, DG ;
Sivasubramani, P ;
Wallace, RM ;
Holländer, B ;
Schubert, J .
APPLIED PHYSICS LETTERS, 2006, 88 (11)
[5]  
HUIJBEN M, UNPUB
[6]   Very Large Capacitance Enhancement in a Two-Dimensional Electron System [J].
Li, Lu ;
Richter, C. ;
Paetel, S. ;
Kopp, T. ;
Mannhart, J. ;
Ashoori, R. C. .
SCIENCE, 2011, 332 (6031) :825-828
[7]   Oxide Interfaces-An Opportunity for Electronics [J].
Mannhart, J. ;
Schlom, D. G. .
SCIENCE, 2010, 327 (5973) :1607-1611
[8]   A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface [J].
Ohtomo, A ;
Hwang, HY .
NATURE, 2004, 427 (6973) :423-426
[9]   Parallel Electron-Hole Bilayer Conductivity from Electronic Interface Reconstruction [J].
Pentcheva, R. ;
Huijben, M. ;
Otte, K. ;
Pickett, W. E. ;
Kleibeuker, J. E. ;
Huijben, J. ;
Boschker, H. ;
Kockmann, D. ;
Siemons, W. ;
Koster, G. ;
Zandvliet, H. J. W. ;
Rijnders, G. ;
Blank, D. H. A. ;
Hilgenkamp, H. ;
Brinkman, A. .
PHYSICAL REVIEW LETTERS, 2010, 104 (16)
[10]   Microlithography of electron gases formed at interfaces in oxide heterostructures [J].
Schneider, C. W. ;
Thiel, S. ;
Hammerl, G. ;
Richter, C. ;
Mannhart, J. .
APPLIED PHYSICS LETTERS, 2006, 89 (12)