Chemical vapor deposition of silicon dioxide by direct-current corona discharges in dry air containing octamethylcyclotetrasiloxane vapor: Measurement of the deposition rate

被引:9
|
作者
Chen, JH
Davidson, JH [1 ]
机构
[1] CALTECH, Dept Chem Engn, Pasadena, CA 91125 USA
[2] Univ Minnesota, Dept Mech Engn, Minneapolis, MN 55455 USA
关键词
corona plasma; corona-enhanced chemical vapor deposition (CECVD); octamethylcyclotetrasiloxane (OMCTS); electrostatic precipitator;
D O I
10.1023/B:PCPP.0000013197.77036.f5
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Experiments in a positive-polarity, wire/plate electrode establish the effects of the concentration of octamethylcyclotetrasiloxane (150 - 1100 ppm) and the operating current (0.5 - 2.55 muA/cm length of wire) on the rate of deposition of silicon dioxide on the high voltage wire. The wire is 100 mm radius tungsten and the wire-to-plate spacing is 1.5 cm. Analyses of the deposit with X-ray diffraction, energy dispersive X-ray spectroscopy, and X-ray photoelectron spectroscopy show that it is amorphous silicon dioxide. The deposition rate increases linearly with increasing silicone concentration and corona current. For the concentrations of silicone likely to present in indoor air, the gas-phase processes limit the rate of deposition.
引用
收藏
页码:169 / 188
页数:20
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