Moment reversal characterization of thin magnetic film by VSM or AGFM

被引:12
作者
Shan, ZS [1 ]
Xu, YF
Wang, JP
Chong, TC
Malhotra, SS
Staffort, DC
Zhu, CX
机构
[1] NUS, Data Storage Inst, Singapore 117608, Singapore
[2] Komag Inc, San Jose, CA 95131 USA
关键词
anisotropy; moment-decay; switching volume; thermal stability factor;
D O I
10.1109/20.951016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An approach has been developed to determine the thermal stability factor (KuV*/k(B)T), switching volume (V*), anisotropy (K-u), and dynamic coercivity (H-C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt:C and CoCrPt:SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.
引用
收藏
页码:1944 / 1946
页数:3
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