NIR spectrophotometry characterization of ITO electronic property changes at the interface with a PPV derivative

被引:18
作者
Davenas, J
Besbes, S
Ben Ouada, H
机构
[1] Univ Lyon 1, F-69622 Villeurbanne, France
[2] Fac Sci, Lab Phys Interfaces, Monastir 5000, Tunisia
关键词
ITO; drude theory; plasma frequency; charge carrier density; dipole layer;
D O I
10.1016/S0379-6779(02)01296-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic effects at polymer/indium tin oxide (ITO) interface play a crucial role in light-emitting devices as controlling charge injection. Near-infrared spectrophotometry has been used to characterize the modifications of the ITO electronic properties induced by the deposition of a PPV derivative. Near-infrared (NIR) spectra have been analyzed using Drude free electron theory providing information on the free carriers density and local conductivity. The optical analysis reveals a 10% reduction of the ITO free carrier concentration at the contact with the PPV derivative, which has been attributed to the formation of a polarization layer at the interface. Comparison has been done between polymer deposited directly on ITO or on ITO functionalized with a phosphonic acid layer (SAM) to improve the electronic/polymer interface. The NIR study indicates that charge transfers occur with the first deposited layer, providing confirmation of an interface effect. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:295 / 298
页数:4
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